points by josh-wrale 11 hours ago | 0 comments
Fair. I guess it would be necessary to CT scan them, like the Vesuvius Challenge
[–] dgfl 9 hours ago
[–] Arubis 7 hours ago
You can destructively deprocess dies, removing a layer at a time and imaging at each layer. 20ish years ago you could still do this with a polishing wheel and a fine slurry; don’t know if that’s still viable.
I would imagine this is of decent interest to people reverse engineering chip designs, or doing failure analysis, so it’s possible someone might actually be trying this at scale.